NASA NTRS · 19790000472
JANTX1N5614 switching siode
Abstract
Diode manufactured by Micro Semiconductor and Semtech were tested. Main failure mode was surface inversions caused by leakage of contaminants through cracks in glass. Most failures in groups 2 and 3 were visual.
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1980-06-01. JANTX1N5614 switching siode. https://ntrs.nasa.gov/citations/19790000472
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