NASA NTRS · 19790000468
JANTX1N5420 diode
Abstract
Testing of sample lots from Unitrode and Micro Semiconductor had to be stopped in group 1 test because 50% failure rate limit was reached. Failure analysis was performed only for group 2 testing because of apparent failure mode.
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1980-06-01. JANTX1N5420 diode. https://ntrs.nasa.gov/citations/19790000468
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