NASA NTRS · 19790000456
JANTX1N645-1 diode
Abstract
Samples manufactured by Semtech were tested. Devices showed excessine reverse leakage currents during each of three test phases. Results of testing suggest that failures occurred because of static charge on surface of encapsulant, caused by thermal decomposition of paint.
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1980-06-01. JANTX1N645-1 diode. https://ntrs.nasa.gov/citations/19790000456
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