NASA NTRS · 19780000547
Detecting surface deformations photographically
Abstract
Simple photographic technique detects cracks and changes as small as 0.08 mm in surface contours of opaque objects subjected to environmental and other tests.
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Beckerle, L. D., Robson, J. R.. 1979-03-01. Detecting surface deformations photographically. https://ntrs.nasa.gov/citations/19780000547
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