NASA NTRS · 19770048391
Microchannel plate life tests
Abstract
The behavior of the gain of a microchannel plate (MCP) during operation of the latter at moderate output currents was investigated. The total charge per unit area, Q, extracted from the MCP is shown to be the relevant quantity for evaluating MCP performance. The shape of the gain versus Q curve provides information on the gain decay process. Long periods of stable gain, frequently exhibited by channeltrons, were not observed in the present experiment.
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Sandel, B. R., Broadfoot, A. L., Shemansky, D. E.. 1977-05-01. Microchannel plate life tests. https://ntrs.nasa.gov/citations/19770048391
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