NASA NTRS · 19760000586
Elastrostatic-discharge damage to semiconductors
Abstract
Failure mechanisms, test techniques, and quality control procedures for difficult-to-detect class of failures have been devised. Test circuit provides electrostatic discharge similar to those encountered in production situation and assists in evaluation of susceptibility of specific circuits and devices
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Freeman, E. R., Jr., Beall, J. R.. 1977-03-01. Elastrostatic-discharge damage to semiconductors. https://ntrs.nasa.gov/citations/19760000586
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