NASA NTRS · 19750000069
High-temperature capacitive strain measurement system
Abstract
Capacitive strain gage and signal conditioning system measures stress-induced strain and cancels thermal expansion strain at temperatures to 1,500 F (815 C). Gage does not significantly restrain or reinforce specimen.
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Wilson, E. J., Egger, R. L.. 1975-05-01. High-temperature capacitive strain measurement system. https://ntrs.nasa.gov/citations/19750000069
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