NASA NTRS · 19730023128
Induced shock pulse testing by transient waveform control
Abstract
A method of synthesizing an arbitrarily shaped transient time pulse on vibration exciters is described. The transient waveform control technique is based on recent developments in digital time series analysis, the real-time FFT processor. A brief description of the theory, error estimates and hardware/software implementation to the JPL Dynamic Environmental Testing Laboratory is presented.
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Kim, B. K.. 1973-07-01. Induced shock pulse testing by transient waveform control. https://ntrs.nasa.gov/citations/19730023128
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