Test stand system for vacuum chambers

Abstract

A test stand system for supporting test items in a vacuum chamber is described. The system consists of a frame adapted to conform to the inside of the vacuum chamber and supporting a central vertical shaft. The shaft rotates on bearings located at each end of the shaft. Several vertically spaced plates which fixed to the vertical shaft may be adjusted for height to support the test equipment as required. The test equipment may be rotated during tests without disturbing the vacuum by a manually actuated drive external to the vacuum chamber.