NASA NTRS · 19710000282
Improved charged-particle analyzer - A concept
Abstract
Device utilizes concept that charged-particle analysis is achievable by applying sinusoidal voltage across two conductive deflection plates with predetermined curvature and constant spacing to define selective passageway for charged particles to be analyzed. Four advantages of improved device are cited.
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Dimeff, J.. 1971-08-01. Improved charged-particle analyzer - A concept. https://ntrs.nasa.gov/citations/19710000282
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