NASA NTRS · 19690008025
Curtailed attribute sampling
Abstract
Maximum likelihood estimation of lot defectives based on curtailed attribute sampling
Keep this discovery
Explore connections, maps & timelines
Cohen, A. C.. 1969-01-01. Curtailed attribute sampling. https://ntrs.nasa.gov/citations/19690008025
Cite the original work for its findings. Save a collection to share your selection of sources.