TY  - RPRT
TI  - Improving creep resistance of Al-0.27Zr-0.08Sn (wt%) via cold swaging while maintaining high electrical conductivity
AU  - Coello ramirez, Ismael [Northwestern University,]
AU  - Bahl, Sumit [ORNL] (ORCID:0000000294715001)
AU  - Qi, Jie [Northwestern University, Evanston]
AU  - Allard Jr, Lawrence [ORNL] (ORCID:0000000245528277)
AU  - Fancher, Christopher [ORNL] (ORCID:0000000239525168)
AU  - Shyam, Amit [ORNL] (ORCID:0000000267224709)
AU  - Dunand, David C [Northwestern University,]
PY  - 2026
DO  - 10.1016/j.msea.2026.150834
UR  - https://www.osti.gov/biblio/3682510
ID  - 3682510
ER  -