@misc{indiciaed75bcda9778b,
  title = {Improving creep resistance of Al-0.27Zr-0.08Sn (wt\%) via cold swaging while maintaining high electrical conductivity},
  author = {Coello ramirez, Ismael [Northwestern University,] and Bahl, Sumit [ORNL] (ORCID:0000000294715001) and Qi, Jie [Northwestern University, Evanston] and Allard Jr, Lawrence [ORNL] (ORCID:0000000245528277) and Fancher, Christopher [ORNL] (ORCID:0000000239525168) and Shyam, Amit [ORNL] (ORCID:0000000267224709) and Dunand, David C [Northwestern University,]},
  year = {2026},
  doi = {10.1016/j.msea.2026.150834},
  url = {https://www.osti.gov/biblio/3682510},
  note = {Source identifier: 3682510}
}