TY  - RPRT
TI  - Chemical tuning of electronic and transport properties of the Bi–Se–Te family of topological insulators
AU  - Doyle, Maxwell [Iowa State University; Division of Materials Science and Engineering]
AU  - Schrunk, Benjamin [Division of Materials Science and Engineering]
AU  - Schlagel, D L [Division of Materials Science and Engineering]
AU  - Lograsso, Thomas A [Division of Materials Science and Engineering]
AU  - Kaminski, Adam [Iowa State University; Division of Materials Science and Engineering] (ORCID:0000000211707875)
PY  - 2026
DO  - 10.1088/1361-648x/ae99bf
UR  - https://www.osti.gov/biblio/3607609
ID  - 3607609
ER  -