TY  - RPRT
TI  - Quasi-In-Situ Analysis of Electrode Top Atomic Layers via High-Sensitivity Low-Energy Ion Scattering and Potential-Controlled Sample Transfer
AU  - Ding, Haoran [University of Colorado, Boulder, CO (United States)]
AU  - Ramos, Nathanael C. [University of Colorado, Boulder, CO (United States)] (ORCID:0000000247210350)
AU  - Parulekar, Anish [University of Colorado, Boulder, CO (United States)]
AU  - Holewinski, Adam [University of Colorado, Boulder, CO (United States)] (ORCID:0000000183075881)
PY  - 2026
DO  - 10.1021/acs.chemmater.5c02629
UR  - https://www.osti.gov/biblio/3374347
ID  - 3374347
ER  -