TY  - RPRT
TI  - Elucidating microstructural evolution and hardness variation across friction self-piercing riveted Al-7055 using synchrotron X-ray scattering and advanced microscopy techniques
AU  - Kamath, Rakesh R. [Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Wang, Tianzhao [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Lim, Yong Chae [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Su, Yi-Feng [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Ilavsky, Jan [Argonne National Laboratory (ANL), Argonne, IL (United States)]
AU  - Wang, Yiyu [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Li, Yuan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Jun, Jiheon [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Feng, Zhili [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Singh, Dileep [Argonne National Laboratory (ANL), Argonne, IL (United States)]
PY  - 2026
DO  - 10.1016/j.matchar.2026.116166
UR  - https://www.osti.gov/biblio/3371925
ID  - 3371925
ER  -