@misc{indiciaefb4a07bf2f6a,
  title = {Investigating Nitrogen Diffusion in Silicon through Scanning Tunneling Microscopy},
  author = {Sheridan, Thomas Robert [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000262474418) and Ivie, Jeffrey Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000198428475) and Allemang, Christopher Richard [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000187120782) and Campbell, DeAnna Marie [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000235051065)},
  year = {2025},
  doi = {10.2172/3365829},
  url = {https://www.osti.gov/biblio/3365829},
  note = {Source identifier: 3365829}
}