TY  - RPRT
TI  - Data driven methods to recognize patterns in EIC weak-strong simulation
AU  - Fung, William [Michigan State Univ., East Lansing, MI (United States)]
PY  - 2025
DO  - 10.18429/jacow-ipac2025-wepm019
UR  - https://www.osti.gov/biblio/3029507
ID  - 3029507
ER  -