TY  - RPRT
TI  - The influence of V-defects, leakage, and random alloy fluctuations on the carrier transport in red InGaN MQW LEDs
AU  - Huang, Huai-Chin [National Taiwan Univ., Taipei (Taiwan)] (ORCID:0009000638995893)
AU  - Chen, Shih-Min [National Taiwan Univ., Taipei (Taiwan)]
AU  - Weisbuch, Claude [Ecole Polytechnique, Palaiseau (France)] (ORCID:0000000154035274)
AU  - Speck, James S. [Univ. of California, Santa Barbara, CA (United States)] (ORCID:0000000280454090)
AU  - Wu, Yuh-Renn [National Taiwan Univ., Taipei (Taiwan)] (ORCID:0000000214573681)
PY  - 2025
DO  - 10.1063/5.0261821
UR  - https://www.osti.gov/biblio/3023039
ID  - 3023039
ER  -