@misc{indiciae60864ac571ee,
  title = {The influence of V-defects, leakage, and random alloy fluctuations on the carrier transport in red InGaN MQW LEDs},
  author = {Huang, Huai-Chin [National Taiwan Univ., Taipei (Taiwan)] (ORCID:0009000638995893) and Chen, Shih-Min [National Taiwan Univ., Taipei (Taiwan)] and Weisbuch, Claude [Ecole Polytechnique, Palaiseau (France)] (ORCID:0000000154035274) and Speck, James S. [Univ. of California, Santa Barbara, CA (United States)] (ORCID:0000000280454090) and Wu, Yuh-Renn [National Taiwan Univ., Taipei (Taiwan)] (ORCID:0000000214573681)},
  year = {2025},
  doi = {10.1063/5.0261821},
  url = {https://www.osti.gov/biblio/3023039},
  note = {Source identifier: 3023039}
}