TY  - RPRT
TI  - Defect Complexes in CrSBr Revealed Through Electron Microscopy and Deep Learning
AU  - Weile, Mads [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000198225942)
AU  - Grytsiuk, Sergii [Radboud Univ., Nijmegen (Netherlands)] (ORCID:0000000304996944)
AU  - Penn, Aubrey [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000175861655)
AU  - Chica, Daniel G. [Columbia Univ., New York, NY (United States)]
AU  - Roy, Xavier [Columbia Univ., New York, NY (United States)] (ORCID:0000000288500725)
AU  - Mosina, Kseniia [Univ. of Chemistry and Technology, Prague (Czech Republic)] (ORCID:0000000335705337)
AU  - Sofer, Zdenek [Univ. of Chemistry and Technology, Prague (Czech Republic)]
AU  - Schiøtz, Jakob [Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000206708013)
AU  - Helveg, Stig [Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000203288295)
AU  - Rösner, Malte [Radboud Univ., Nijmegen (Netherlands)] (ORCID:0000000261992176)
AU  - Ross, Frances M. [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000308389770)
AU  - Klein, Julian [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000208738224)
PY  - 2025
DO  - 10.1103/physrevx.15.021080
UR  - https://www.osti.gov/biblio/3022038
ID  - 3022038
ER  -