@misc{indiciaeca928e6e4b40,
  title = {Defect Complexes in CrSBr Revealed Through Electron Microscopy and Deep Learning},
  author = {Weile, Mads [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000198225942) and Grytsiuk, Sergii [Radboud Univ., Nijmegen (Netherlands)] (ORCID:0000000304996944) and Penn, Aubrey [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000175861655) and Chica, Daniel G. [Columbia Univ., New York, NY (United States)] and Roy, Xavier [Columbia Univ., New York, NY (United States)] (ORCID:0000000288500725) and Mosina, Kseniia [Univ. of Chemistry and Technology, Prague (Czech Republic)] (ORCID:0000000335705337) and Sofer, Zdenek [Univ. of Chemistry and Technology, Prague (Czech Republic)] and Schiøtz, Jakob [Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000206708013) and Helveg, Stig [Technical Univ. of Denmark, Lyngby (Denmark)] (ORCID:0000000203288295) and Rösner, Malte [Radboud Univ., Nijmegen (Netherlands)] (ORCID:0000000261992176) and Ross, Frances M. [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000308389770) and Klein, Julian [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000208738224)},
  year = {2025},
  doi = {10.1103/physrevx.15.021080},
  url = {https://www.osti.gov/biblio/3022038},
  note = {Source identifier: 3022038}
}