TY  - RPRT
TI  - Detection of Critical Surface Features in PTLs and GDLs for Improved Device Performance and Manufacturing Reliability
AU  - Vazquez, Maya [National Laboratory of the Rockies, Golden, CO (United States)]
AU  - Rupnowski, Peter [National Laboratory of the Rockies, Golden, CO (United States)] (ORCID:000000030040418X)
PY  - 2026
DO  - 10.2172/3014927
UR  - https://www.osti.gov/biblio/3014927
ID  - 3014927
ER  -