@misc{indiciaebfdba61a5da4,
  title = {Detection of Critical Surface Features in PTLs and GDLs for Improved Device Performance and Manufacturing Reliability},
  author = {Vazquez, Maya [National Laboratory of the Rockies, Golden, CO (United States)] and Rupnowski, Peter [National Laboratory of the Rockies, Golden, CO (United States)] (ORCID:000000030040418X)},
  year = {2026},
  doi = {10.2172/3014927},
  url = {https://www.osti.gov/biblio/3014927},
  note = {Source identifier: 3014927}
}