TY  - RPRT
TI  - Semiconductor-compatible topological digital alloys
AU  - Liang, Yunfan [Rensselaer Polytechnic Institute, Troy, NY (United States)]
AU  - West, Damien [Rensselaer Polytechnic Institute, Troy, NY (United States)]
AU  - Chen, Shunda [George Washington University, Washington, DC (United States)]
AU  - Liu, Jifeng [Dartmouth College, Hanover, NH (United States)]
AU  - Li, Tianshu [George Washington University, Washington, DC (United States)]
AU  - Zhang, Shengbai [Rensselaer Polytechnic Institute, Troy, NY (United States)]
PY  - 2025
DO  - 10.1016/j.mattod.2025.03.017
UR  - https://www.osti.gov/biblio/3001339
ID  - 3001339
ER  -