TY  - RPRT
TI  - Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering
AU  - Shen, Chen [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)] (ORCID:0000000278551764)
AU  - Zhang, Honghu [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000317847825)
AU  - Klösgen, Beate [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Southern Denmark, Odense (Denmark)] (ORCID:0000000223340388)
AU  - Ocko, Benjamin M. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000325961206)
PY  - 2025
DO  - 10.1103/znt1-fmx6
UR  - https://www.osti.gov/biblio/3000533
ID  - 3000533
ER  -