@misc{indiciae95702b22de76,
  title = {Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering},
  author = {Shen, Chen [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)] (ORCID:0000000278551764) and Zhang, Honghu [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000317847825) and Klösgen, Beate [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. of Southern Denmark, Odense (Denmark)] (ORCID:0000000223340388) and Ocko, Benjamin M. [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000325961206)},
  year = {2025},
  doi = {10.1103/znt1-fmx6},
  url = {https://www.osti.gov/biblio/3000533},
  note = {Source identifier: 3000533}
}