TY  - RPRT
TI  - Imaging the Acceptor Wave Function Anisotropy in Silicon
AU  - Siegl, Manuel [Univ. College London (United Kingdom)]
AU  - Zanon, Julian [Eindhoven Univ. of Technology (Netherlands)] (ORCID:0000000228301361)
AU  - Sink, Joseph [Univ. of Iowa, Iowa City, IA (United States)] (ORCID:0000000249691565)
AU  - Rodrigues da Cruz, Adonai [Univ. of Iowa, Iowa City, IA (United States)] (ORCID:000000018719399X)
AU  - Hedgeland, Holly [Univ. College London (United Kingdom)] (ORCID:0000000337037942)
AU  - Curson, Neil J. [Univ. College London (United Kingdom)] (ORCID:0000000256610559)
AU  - Flatté, Michael E. [Eindhoven Univ. of Technology (Netherlands)] (ORCID:0000000150931549)
AU  - Schofield, Steven R. [Univ. College London (United Kingdom)] (ORCID:0000000207273015)
PY  - 2025
DO  - 10.1021/acs.nanolett.5c02675
UR  - https://www.osti.gov/biblio/2998292
ID  - 2998292
ER  -