TY  - RPRT
TI  - The Impact of Bias Row Noise to Photometric Accuracy: Case Study Based on a Scientific CMOS Detector
AU  - Shao, Li (ORCID:000000032015777X)
AU  - Zhan, Hu (ORCID:0000000317186481)
AU  - Liu, Chao
AU  - Chi, Haonan
AU  - Luo, Qiuyan
AU  - Mu, Huaipu
AU  - Shi, Wenzhong
PY  - 2024
DO  - 10.1088/1674-4527/ad1793
UR  - https://www.osti.gov/biblio/2582275
ID  - 2582275
ER  -