@misc{indiciaef44c82de3743,
  title = {AI‐Driven Defect Engineering for Advanced Thermoelectric Materials},
  author = {Fu, Chu‐Liang [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Cheng, Mouyang [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Hung, Nguyen Tuan [Tohoku University, Sendai (Japan)] and Rha, Eunbi [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Chen, Zhantao [SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Stanford University, CA (United States)] and Okabe, Ryotaro [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Carrizales, Denisse Córdova [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Mandal, Manasi [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Cheng, Yongqiang [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] and Li, Mingda [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000270556368)},
  year = {2025},
  doi = {10.1002/adma.202505642},
  url = {https://www.osti.gov/biblio/2574889},
  note = {Source identifier: 2574889}
}