@misc{indiciae434090ce04fe,
  title = {Spotlight: efficient automated global optimization in rietveld analysis of diffraction data},
  author = {Biwer, Christopher M. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] and Feng, Zhenxing [Univ. of New Hampshire, Durham, NH (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] and Finstad, Daniel [Syracuse Univ., NY (United States)] and McDonnell, Marshall [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000237132117) and Knezevic, Marko [Univ. of New Hampshire, Durham, NH (United States)] and McKerns, Michael [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Uncertainty Quantification Foundation, Wilmington, DE (United States)] (ORCID:0000000183423778) and Savage, Daniel J. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000199732030) and Vogel, Sven C. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000320490361)},
  year = {2025},
  doi = {10.1038/s41598-025-92452-4},
  url = {https://www.osti.gov/biblio/2570774},
  note = {Source identifier: 2570774}
}