TY  - RPRT
TI  - Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing
AU  - Khurana, Mohit (ORCID:0000000207898672)
AU  - Delfan, Sahar
AU  - Yi, Zhenhuan (ORCID:0000000348271013)
PY  - 2025
DO  - 10.1364/oe.558186
UR  - https://www.osti.gov/biblio/2565044
ID  - 2565044
ER  -