@misc{indiciaefa23253c5c1a,
  title = {Effective Defect Detection Using Instance Segmentation for NDI},
  author = {Rahman, Ashiqur [Northern Illinois Univ., DeKalb, IL (United States); Spirit AeroSystems Inc] and Reddy Seethi, Venkata Devesh [Northern Illinois Univ., DeKalb, IL (United States)] and Yunker, Austin [Argonne National Laboratory (ANL), Argonne, IL (United States)] and Kral, Zachary [Spirit AeroSystems, Inc., Wichita, KS (United States)] and Kettimuthu, Rajkumar [Argonne National Laboratory (ANL), Argonne, IL (United States)] and Alhoori, Hamed [Northern Illinois Univ., DeKalb, IL (United States)]},
  year = {2025},
  url = {https://www.osti.gov/biblio/2563178},
  note = {Source identifier: 2563178}
}