@misc{indiciae61de1c2880d7,
  title = {Learning continuous scattering length density profiles from neutron reflectivities using convolutional neural networks},
  author = {Qu, Brian [Oak Ridge High School, Oak Ridge, TN (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000200103718) and Christakopoulos, Panagiotis [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0009000408712528) and Wang, Hanyu [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000187030293) and Keum, Jong K. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000255291373) and Angelopoulou, Polyxeni P. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] and Bonnesen, Peter V. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000213978281) and Hong, Kunlun [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] and Doucet, Mathieu [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000255606478) and Browning, James F. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000018379259X) and Fuentes-Cabrera, Miguel [Northeastern Univ., Boston, MA (United States)] (ORCID:0000000179127079) and Kumar, Rajeev [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000194943488)},
  year = {2024},
  doi = {10.1088/2632-2153/ad9809},
  url = {https://www.osti.gov/biblio/2538273},
  note = {Source identifier: 2538273}
}