@misc{indiciae99ad8e98d1bf,
  title = {Persistent Current Simulation for CCT Testing Magnet Used in EIC},
  author = {Bai, Ye [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000240517077) and Witte, Holger [Brookhaven National Laboratory (BNL), Upton, NY (United States)] and Xu, Peng [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000331969802) and Kumar, Mithlesh [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:000000025360214X) and Notaro, Sara [Brookhaven National Laboratory (BNL), Upton, NY (United States)]},
  year = {2025},
  doi = {10.1109/tasc.2025.3529420},
  url = {https://www.osti.gov/biblio/2525850},
  note = {Source identifier: 2525850}
}