TY  - RPRT
TI  - Invariant discovery of features across multiple length scales: Applications in microscopy and autonomous materials characterization
AU  - Raghavan, Aditya [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000210840666)
AU  - Pratiush, Utkarsh [University of Tennessee, Knoxville, TN (United States)] (ORCID:000900037249103X)
AU  - Valleti, Mani [University of Tennessee, Knoxville, TN (United States)] (ORCID:000000018022647X)
AU  - Liu, Richard (Yu) [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000198719301)
AU  - Emery, Reece [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000157152564)
AU  - Funakubo, Hiroshi [Tokyo Institute of Technology, Yokohama (Japan)] (ORCID:000000021106200X)
AU  - Liu, Yongtao [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000301521783)
AU  - Rack, Philip [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000299643254)
AU  - Kalinin, Sergei [University of Tennessee, Knoxville, TN (United States); Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000153546152)
PY  - 2025
DO  - 10.1063/5.0233070
UR  - https://www.osti.gov/biblio/2512407
ID  - 2512407
ER  -