@misc{indiciae0faf4a3298a4,
  title = {Invariant discovery of features across multiple length scales: Applications in microscopy and autonomous materials characterization},
  author = {Raghavan, Aditya [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000210840666) and Pratiush, Utkarsh [University of Tennessee, Knoxville, TN (United States)] (ORCID:000900037249103X) and Valleti, Mani [University of Tennessee, Knoxville, TN (United States)] (ORCID:000000018022647X) and Liu, Richard (Yu) [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000198719301) and Emery, Reece [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000157152564) and Funakubo, Hiroshi [Tokyo Institute of Technology, Yokohama (Japan)] (ORCID:000000021106200X) and Liu, Yongtao [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000301521783) and Rack, Philip [University of Tennessee, Knoxville, TN (United States)] (ORCID:0000000299643254) and Kalinin, Sergei [University of Tennessee, Knoxville, TN (United States); Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000153546152)},
  year = {2025},
  doi = {10.1063/5.0233070},
  url = {https://www.osti.gov/biblio/2512407},
  note = {Source identifier: 2512407}
}