@misc{indiciaea212dbcefd6f,
  title = {Resonant inelastic x-ray scattering in the topological semimetal FeSi},
  author = {Shen, Yao [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000346974719) and Chandrasekaran, Anirudh [Boston Univ., MA (United States); Loughborough Univ. (United Kingdom)] (ORCID:0000000220412884) and Sears, Jennifer [Brookhaven National Laboratory (BNL), Upton, NY (United States)] and Zhang, Tiantian [Tokyo Institute of Technology (Japan)] and Han, Xin [Chinese Academy of Sciences (CAS), Beijing (China). Inst. of Physics. Beijing National Lab. for Condensed Matter Physics (BNLCP-CAS)] and Shi, Youguo [Chinese Academy of Sciences (CAS), Beijing (China). Inst. of Physics. Beijing National Lab. for Condensed Matter Physics (BNLCP-CAS)] and Li, Jiemin [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000271536123) and Pelliciari, Jonathan [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] and Bisogni, Valentina [Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)] (ORCID:0000000273999930) and Dean, Mark M. [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000151393543) and Kourtis, Stefanos [Univ. of Sherbrooke, QC (Canada); Boston Univ., MA (United States)] (ORCID:0000000291878067)},
  year = {2024},
  doi = {10.1103/physrevb.110.245137},
  url = {https://www.osti.gov/biblio/2503921},
  note = {Source identifier: 2503921}
}