@misc{indiciae832a85b0bfff,
  title = {Dynamic STEM-EELS for single-atom and defect measurement during electron beam transformations},
  author = {Roccapriore, Kevin M. and Torsi, Riccardo and Robinson, Joshua and Kalinin, Sergei V. and Ziatdinov, Maxim},
  year = {2024},
  doi = {10.1126/sciadv.adn5899},
  url = {https://www.osti.gov/biblio/2406455},
  note = {Source identifier: 2406455}
}