@misc{indiciae2516b8047a84,
  title = {Vulnerability Assessments for Power-Electronics-Based Smart Grids},
  author = {Zhang, Jinan and Ye, Jin and Guo, Lulu and Li, Fangyu and Song, Wenzhan},
  year = {2020},
  doi = {10.1109/ecce44975.2020.9235420},
  url = {https://www.osti.gov/biblio/2341865},
  note = {Source identifier: 2341865}
}