TY  - RPRT
TI  - A Statistical Assessment of Zener Diode Behavior Using Functional Data Analysis.
AU  - Champon, Xiaoxia
AU  - Angeles, David
AU  - Buchheit, Thomas
AU  - Canfield, David
AU  - Tucker, James
AU  - Adams, Jason
PY  - 2022
DO  - 10.1109/edtm55494.2023.10103056
UR  - https://www.osti.gov/biblio/2005875
ID  - 2005875
ER  -