TY  - RPRT
TI  - Modeling the electrical double layer at solid-state electrochemical interfaces
AU  - Swift, Michael W.
AU  - Swift, James W.
AU  - Qi, Yue
PY  - 2021
DO  - 10.1038/s43588-021-00041-y
UR  - https://www.osti.gov/biblio/1999186
ID  - 1999186
ER  -