TY  - RPRT
TI  - Interface microstructure effects on dynamic failure behavior of layered Cu/Ta microstructures
AU  - Kumar, Rajesh
AU  - Chen, Jie
AU  - Mishra, Avanish
AU  - Dongare, Avinash M.
PY  - 2023
DO  - 10.1038/s41598-023-37831-5
UR  - https://www.osti.gov/biblio/1989504
ID  - 1989504
ER  -