TY  - RPRT
TI  - Graph-based machine learning improves just-in-time defect prediction
AU  - Bryan, Jonathan
AU  - Moriano, Pablo
PY  - 2023
DO  - 10.1371/journal.pone.0284077
UR  - https://www.osti.gov/biblio/1971024
ID  - 1971024
ER  -