TY  - RPRT
TI  - Exponential Decay of Sensitivity in Graph-Structured Nonlinear Programs
AU  - Shin, Sungho
AU  - Anitescu, Mihai
AU  - Zavala, Victor M.
PY  - 2022
DO  - 10.1137/21m1391079
UR  - https://www.osti.gov/biblio/1962087
ID  - 1962087
ER  -