TY  - RPRT
TI  - Nanoscale defect evaluation framework combining real-time transmission electron microscopy and integrated machine learning-particle filter estimation
AU  - Sasaki, K.
AU  - Muramatsu, M.
AU  - Hirayama, K.
AU  - Endo, K.
AU  - Murayama, M.
PY  - 2022
DO  - 10.1038/s41598-022-13878-8
UR  - https://www.osti.gov/biblio/1904648
ID  - 1904648
ER  -