@misc{indiciaeda94aa32dd61,
  title = {Nanoscale defect evaluation framework combining real-time transmission electron microscopy and integrated machine learning-particle filter estimation},
  author = {Sasaki, K. and Muramatsu, M. and Hirayama, K. and Endo, K. and Murayama, M.},
  year = {2022},
  doi = {10.1038/s41598-022-13878-8},
  url = {https://www.osti.gov/biblio/1904648},
  note = {Source identifier: 1904648}
}