@misc{indiciae1693701230e3,
  title = {Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns},
  author = {Munshi, Joydeep and Rakowski, Alexander and Savitzky, Benjamin H. and Zeltmann, Steven E. and Ciston, Jim (ORCID:0000000287745747) and Henderson, Matthew and Cholia, Shreyas and Minor, Andrew M. and Chan, Maria K. Y. (ORCID:0000000309221363) and Ophus, Colin (ORCID:0000000323488558)},
  year = {2022},
  doi = {10.1038/s41524-022-00939-9},
  url = {https://www.osti.gov/biblio/1903653},
  note = {Source identifier: 1903653}
}