TY  - RPRT
TI  - The Critical Stack Pressure to Alter Void Generation at Li/Solid-Electrolyte Interfaces during Stripping
AU  - Feng, Min
AU  - Yang, Chi-Ta
AU  - Qi, Yue (ORCID:0000000153311193)
PY  - 2022
DO  - 10.1149/1945-7111/ac91aa
UR  - https://www.osti.gov/biblio/1888829
ID  - 1888829
ER  -