TY  - RPRT
TI  - Characterizing Electrical Device Behavior with Functional Tolerance Bounds.
AU  - Adams, Jason
AU  - Tucker, James
AU  - Angeles, David
AU  - Perez, Tabytha
AU  - Buchheit, Thomas
AU  - Reza, Shahed
PY  - 2021
DO  - 10.2172/1888652
UR  - https://www.osti.gov/biblio/1888652
ID  - 1888652
ER  -